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Title:
APPARATUS FOR MEASURING VISIBLE LIGHT, AND METHOD OF MANUFACTURING THE SAME
Document Type and Number:
Japanese Patent JP2010074097
Kind Code:
A
Abstract:

To provide an apparatus for measuring visible light that prevents the variations of the spectral sensitivity of diodes in a manufacturing process, and to provide a method of manufacturing the same.

A large number of sensors are manufactured in the same lot; a plurality of the sensors are extracted as samples from the large number of the sensors manufactured; each series circuit is made non-conductive by disconnecting a first metal fuse 30 and a second metal fuse 32 in any series circuits; and plural kinds of sensors each having a different total area coefficient m are prepared. Photocurrent values output by irradiating light to all of the plural kinds of sensors are measured, and the relative value of each photocurrent value is determined with the maximum value of the measured photocurrent values as a reference value. Then, one sensor having the relative value nearest to the human luminous efficacy characteristics is selected, and a first metal fuse 30 and a second metal fuse 32 are disconnected so that the total area coefficients m of sensors not extracted as samples are the same as that of the selected sensor.


Inventors:
CHIBA TADASHI
Application Number:
JP2008243078A
Publication Date:
April 02, 2010
Filing Date:
September 22, 2008
Export Citation:
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Assignee:
OKI SEMICONDUCTOR CO LTD
International Classes:
H01L31/02
Domestic Patent References:
JP2006318947A2006-11-24
JP2007066983A2007-03-15
Foreign References:
WO2008104928A12008-09-04
Attorney, Agent or Firm:
Atsushi Nakajima
Kato Kazunori
Katsuichi Nishimoto
Hiroshi Fukuda