To provide an apparatus for measuring reflectance properties of an object having a front reflecting surface and at least one back reflecting surface.
The apparatus includes a sample stage for placement of the object 207, a light source 201, a detector 215 configured to detect reflected light from the object, and a positioning device. The positioning device is configured to provide a plurality of angular positions for the light source and the detector relative to the object on the sample stage such that incident light on the object is specularly reflected towards the detector and the reflected light received at the detector includes a front surface reflection from the object and at least one back surface reflection from the object. The method includes illuminating the object at varying angles of incidence, collecting reflected light from the front and back reflecting surfaces of the object at respective specularly reflected angles, wavelength-resolving the reflected light into a color spectrum, and analyzing the intensity of the color spectrum as a function of wavelengths.
JOE R GUTHRIE
PETER ALAN MASCHWITZ
CLIVE HILTON BURTON
VANHLACKY LUCKY SINGHAVARA
BRYAN RICHARD MARSHALL
| JPH11230831A | 1999-08-27 | |||
| JPS6435306A | 1989-02-06 | |||
| JP2004257956A | 2004-09-16 | |||
| JPH0769215B2 | 1995-07-26 | |||
| JP2004526968A | 2004-09-02 |
| WO1987007381A1 | 1987-12-03 |
JPN6014017078; '"ＡＲＳ-５５０／５７０ 自動反射率測定システム"' ＩｎｔｅｒｎｅｔＡｒｃｈｉｖｅ ［ｏｎｌｉｎｅ］ , 20051228
Yoshihiro Fukuhara
Makoto Nakamura
Nobuhisa Nogawa
Toshio Shirane
Takashi Mine
Kocho Chojiro
Naoki Kono
Katsu Sunagawa
Morisezo Iseki
Tatsushi Sato
Takashi Okada
Mihoko Horiuchi
Takenori Masanori
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