Title:
物品検査装置および物品検査システム
Document Type and Number:
Japanese Patent JP7354073
Kind Code:
B2
Abstract:
To provide an article inspection device and an article inspection system capable of quantitatively and easily evaluating how well a change in scattering of actual measurement is relative to a change in scattering of inspection data in production results from display contents.SOLUTION: The article inspection device having an inspection information accumulation part 40 for accumulating inspection data for each identical inspection condition includes: a scattering calculation part 61 for successively calculating an integral value σi for expressing scattering of inspection data for each batch for accumulated inspection data during a current operation monitoring period; a scattering limit setting part 63 for setting tolerance of the integral value σi for expressing scattering by a scattering upper-limit value UCL converged to a predetermined scattering reference value according to a time transition from predetermined reference timing; and a display operation part 70 for comparably displaying a time transition of the scattering upper-limit value UCL and a time transition of the integral value σi for expressing scattering calculated by the scattering calculation part 61.SELECTED DRAWING: Figure 1
Inventors:
Daisuke Wakamatsu
Application Number:
JP2020157480A
Publication Date:
October 02, 2023
Filing Date:
September 18, 2020
Export Citation:
Assignee:
Anritsu Corporation
International Classes:
G01G23/42; G01G11/00; G05B19/418
Domestic Patent References:
| JP2005134310A | ||||
| JP2015097024A | ||||
| JP2014185971A | ||||
| JP2010164370A | ||||
| JP2002236049A | ||||
| JP2001041808A | ||||
| JP4183561A | ||||
| JP59081797A |
Attorney, Agent or Firm:
Ariga International Patent Office