Automatic analysis device - Hitachi High-Technologies Corporation

Title:

Automatic analysis device

Document Type and Number:

Japanese Patent JP5984584

Kind Code:

B2

Abstract:

Provided is an automatic analyzer capable of detecting not only clogging and air suction of the dispensation probe but also a decrease in the dispensation quantity caused by a bubble film, air bubbles or a highly viscous sample. Each of a sample/reagent suction operation time and a sample/reagent discharge operation time of a probe is segmented into multiple time sections. For each of the time sections determined by the segmentation, a parameter is calculated by applying a detected pressure waveform to an approximation formula. For each of the time section, the presence/absence of a dispensation abnormality is judged by comparing the calculated parameter with a parameter in cases of normal dispensation. An automatic analyzer capable of judging the presence/absence of an abnormality specific to each time section and making abnormality judgments difficult for conventional techniques can be realized.

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Inventors:

Tomonori Mimura
Kumiko Kamihara
Kung Fu Yamazaki
Hideto Tamezomi

Application Number:

JP2012188062A

Publication Date:

September 06, 2016

Filing Date:

August 28, 2012

Export Citation:

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