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Patent Searching and Data


Title:
CACHE MEMORY TESTING METHOD
Document Type and Number:
Japanese Patent JPH03113659
Kind Code:
A
Abstract:

PURPOSE: To conduct a test on an instruction cache memory only by means of adding a test mode signal to an instruction decoder by checking the built-in instruction cache memory at the external part of a micro processor.

CONSTITUTION: When a signal 104 comes to '1' and is inputted, the instruction decoder 10 continuously outputs '0' even if the instruction code of a signal 105 comes to any value. A content which is read from the instruction cache memory 6 is inputted to a computing element 17, which outputs data as it is and sets it in a register 18. Then, a program sequencer 12 generates a subsequent address, sequentially reads the instruction cache memory 6 and outputs it to a data address bus 102, namely, the external part of the micro processor. Thus, the test of the instruction cache memory 6 is conducted only by adding the test mode signal for instruction decoding and without adding hardware for the test and without cache access being delayed.


Inventors:
NARITA YOSHITAKA
Application Number:
JP25278489A
Publication Date:
May 15, 1991
Filing Date:
September 28, 1989
Export Citation:
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Assignee:
OKI ELECTRIC IND CO LTD
International Classes:
G06F12/08; G06F12/16; (IPC1-7): G06F12/08; G06F12/16
Attorney, Agent or Firm:
Takashi Kumagai (1 outside)