Title:
検量装置および検量方法
Document Type and Number:
Japanese Patent JP7006423
Kind Code:
B2
Abstract:
To accurately measure a target component even when measurement data derived from a plurality of components is not statistically independent.SOLUTION: An analysis processing unit generates element sequence for each of R subsets generated from a set of Q optical spectra, executes independent component analysis with N types of component amounts as independent components for each of the R subsets to specify a spectrum for measuring a component, selects B subsets from the R subsets, changes one or more elements for B element sequences corresponding respectively to the B subsets to generate R element sequences, and after repetition of the specification of the spectrum for measuring a component and the selection of the B subsets, specifies a spectrum for measuring a target component and a calibration curve from the plurality of spectra for measuring a component. The element sequence consists of Q elements corresponding respectively to Q optical spectra, the elements of the optical spectra included in the subsets is set to 1 and each of the residual elements is set to 0.SELECTED DRAWING: Figure 6
Inventors:
Hikari Kurasawa
Application Number:
JP2018054481A
Publication Date:
February 10, 2022
Filing Date:
March 22, 2018
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01N21/27
Domestic Patent References:
| JP2016075625A | ||||
| JP2015135318A | ||||
| JP2013160574A | ||||
| JP2009113717A |
Foreign References:
| WO2017100424A1 | ||||
| US20040148106 |
Attorney, Agent or Firm:
Akira Obayashi
Seiichi Takada
Taro Takahashi
Seiichi Takada
Taro Takahashi
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