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Title:
CLINICAL EXAMINATION SYSTEM
Document Type and Number:
Japanese Patent JP2006017600
Kind Code:
A
Abstract:

To provide a waste-avoided efficient clinical examination system, capable of checking the measuring data obtained by an analyzer, on the basis of the accumulation data of a precision control specimen and reporting valuable examination data of higher quality to a medical examination and treatment office.

With respect to the abnormality, which is not cleared by the independent check of precision control, of the analyzer, an estimate becoming out of a control SD range from a precision control reference value is calculated from an estimate straight line, on the basis of the accumulation data of the precision control specimen, by controlling the precision control specimen from the analyzer and a warning is reported to a user before the analyzer becomes abnormal to ensure the measuring precision of a patient specimen data and the reliability of data, simultaneously with the holding of the analyzer to a stable state.


Inventors:
HANAWA SHUNEI
YOSHIMURA TATSUYA
Application Number:
JP2004196247A
Publication Date:
January 19, 2006
Filing Date:
July 02, 2004
Export Citation:
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Assignee:
HITACHI SCIENCE SYSTEMS LTD
International Classes:
G01N35/00
Domestic Patent References:
JPH08262031A1996-10-11
JP2001091518A2001-04-06
JPH08101208A1996-04-16
JPS6314289A1988-01-21
JPH06308131A1994-11-04
JP2000097946A2000-04-07
JP2001004633A2001-01-12
JP2001229291A2001-08-24
JP2003279583A2003-10-02
Attorney, Agent or Firm:
Katsuo Ogawa
Kyosuke Tanaka