Title:
色むら検査装置および色むら検査方法
Document Type and Number:
Japanese Patent JP5471306
Kind Code:
B2
Abstract:
A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup section, and by classifying unit regions included in each of the uneven-color regions into a plurality of color groups; a calculation section calculating, on the uneven-color regions in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; a correction section making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups; and an inspection section performing the color-unevenness inspection, based on a resultant evaluation parameter obtained by the correction.
Inventors:
Kunihiko Nagamine
Satoshi Tomioka
Satoshi Tomioka
Application Number:
JP2009248119A
Publication Date:
April 16, 2014
Filing Date:
October 28, 2009
Export Citation:
Assignee:
ソニー株式会社
International Classes:
G01M11/00; G01J3/50; G02F1/13
Domestic Patent References:
| JP2528929B2 |
Other References:
浅野 敏郎、川目 啓介、望月 淳、福原 信雄,「カラーCRTディスプレイの白色均一性定量評価」,電子情報通信学会論文誌D-II,1990年 6月25日,Vol. J73-D-II, No. 6,p. 830-839
浅野 敏郎、大岡 達史、玉野 和保,「色対比を考慮した電子ディスプレイ色むら評価モデル」,精密工学会誌論文集,2005年 1月 5日,Vol. 71, No. 1,p. 89-93
浅野 敏郎、大岡 達史、玉野 和保,「色対比を考慮した電子ディスプレイ色むら評価モデル」,精密工学会誌論文集,2005年 1月 5日,Vol. 71, No. 1,p. 89-93
Attorney, Agent or Firm:
Yoichiro Fujishima
Yasushi Santanzaki
Masao Hasebe
Takaaki Tanaami
Yasushi Santanzaki
Masao Hasebe
Takaaki Tanaami