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Title:
COMPOUND SEMICONDUCTOR THIN FILM
Document Type and Number:
Japanese Patent JPS647614
Kind Code:
A
Abstract:

PURPOSE: To obtain a thin GaAS film having remarkably small carbon mixture amount by incorporating specific amount of Sb in the film to overcome a disadvantage of a MOCVD method.

CONSTITUTION: Sb is contained as 0.05W0.3% of GaSb in a thin GaAS film. The reason why the concentration of the Sb in the GaAS as the GaSb is 0.05W0.3% is because it is desired to set to 0.3% or less to endure a distortion due to lattice misalignment in the thin GaAS film of several μm of thickness while it is desired to contain 0.05% or more to generate an Sb doping effect. For example, an Sb-doped thin GaAS thin film having 0.15% of Sb amount as the GaSb is grown on a 2° OFF semiinsulating GaAS substrate (100) under growing conditions of 0.04cc of SbH2 added by MOCVD method, 640°C of substrate temperature, 5 l/min of H2 gas flow rate, atmospheric pressure in a reaction tube 1.1cc of Ga(CH3)3 flow rate and 12.4cc of AsH3 flow rate.


Inventors:
YOSHIDA MASAJI
Application Number:
JP16122387A
Publication Date:
January 11, 1989
Filing Date:
June 30, 1987
Export Citation:
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Assignee:
NEC CORP
International Classes:
H01L21/205; (IPC1-7): H01L21/205
Attorney, Agent or Firm:
Chieko Tateno



 
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