To provide a contact chip structure of a connection element having a structure capable of forming a scrub in a constant form on an electrode pad.

The contact chip structure of the connection element has a fixing post coupled with a surface of a first electronic component and extends vertically from a lower surface of a base coupled to one end of a beam extending from the fixing post. The beam includes an elastic region and a non-elastic region with an extension distance shorter than that of the elastic region. The base extends vertically from the non-elastic region by a constant distance. A horizontal extension length L of the elastic region of the beam and a vertical extension length D of the base are determined so that a horizontal moving distance of the contact chip has a predetermined length. In addition, the horizontal moving distance is expressed by the following equation: Dsin+L(cos-1) ( refers to an elastic deformation angle of the elastic region).