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Title:
コンタクトピン及びそれを有する試験台
Document Type and Number:
Japanese Patent JP6818986
Kind Code:
B2
Abstract:
A contact pin (100; 10012, 10032) for electrically connecting a first electrical contact area (13), which is arranged on a device under test (300) to be surveyed, and a second electrical contact area (17), which is arranged in a test base (200; 200′), has an elongate central region (1) which is mechanically connected to the test base (200; 200′), has a first spring arm (21), the first end (41) of which is connected to a first end (5) of the central region (1) and the second end (111) of which has a first contact region (12) for electrical contact-connection to the first electrical contact area (13), and has a second spring arm (31), the first end (61) of which is connected to a first or second end (5, 7) of the central region (1) and the second end (151) of which has a second contact region (16) for electrical contact-connection to the second electrical contact area (17). The first and the second spring arm (21, 31) are each oriented, in the region of their first end (41, 61), at an angle (ϕ1, ϕ2) in relation to a longitudinal axis (9) of the central region (1), which angle is smaller than or equal to 90°.

Inventors:
Ray Sur, Stephan
Hoover, Rudwick
Application Number:
JP2018553881A
Publication Date:
January 27, 2021
Filing Date:
April 07, 2017
Export Citation:
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Assignee:
Rosenberger Hofflex Benz Technik Gamebeher and Company
International Classes:
G01R1/067; G01R31/26
Domestic Patent References:
JP2002365308A
JP2001237040A
JP2006132982A
JP2010534851A
JP2005069711A
JP7254468A
Foreign References:
WO2014073368A1
Attorney, Agent or Firm:
Longhua International Patent Service Corporation