DEFORMATION AMOUNT MEASURING EQUIPMENT FOR STRUCTURE - MITSUBISHI HEAVY INDUSTRIES,LTD.

Title:

DEFORMATION AMOUNT MEASURING EQUIPMENT FOR STRUCTURE

Document Type and Number:

Japanese Patent JP3546130

Kind Code:

B2

Abstract:

PROBLEM TO BE SOLVED: To detect the amount of deformation of a structure in the three- dimensional direction, with high sensitivity.
SOLUTION: An optical fiber 9 is laid between an optical fiber upper fixing jig 20 and an optical fiber lower fixing jig 21 which have wavy surfaces 22, 23, respectively. According to the deformation of a tunnel inner wall la as a structure, the optical fiber upper fixing, jig 20 is deformed. According to the deformation of the jig 20, stretch in the three-dimensional direction is applied to the optical fiber 9. Thereby the amount of deformation of the tunnel inner wall la in the three-dimensional direction is obtained.

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Inventors:

Yoshio Kaito
Taketoshi Yamaura
Yoshiaki Inoue
Tadashi Sugimura
Masazumi Tsukano

Application Number:

JP33994797A

Publication Date:

July 21, 2004

Filing Date:

December 10, 1997

Export Citation:

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Assignee:

MITSUBISHI HEAVY INDUSTRIES,LTD.

International Classes:

E21F17/00; G01B11/16; (IPC1-7): G01B11/16

Domestic Patent References:

JP58501336A
JP5990025A

Attorney, Agent or Firm:

Takehiko Suzue
Sadao Muramatsu
Atsushi Tsuboi
Ryo Hashimoto

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