Title:
【発明の名称】温度補償された対数検出器
Document Type and Number:
Japanese Patent JP2000504900
Kind Code:
A
Abstract:
A temperature compensated logarithmic detector biased with a proportional to absolute temperature (PTAT) voltage produced in accordance with an area ratio of biasing transistors is disclosed. According to one implementation of the invention, the temperature compensated logarithmic detector includes biasing circuitry and a logarithmic detector cell. The biasing circuitry receives an input signal and produces a PTAT bias voltage from the input signal. The PTAT characteristic of the PTAT bias voltage is produced by an area ratio. The logarithmic detector cell converts the input signal to a logarithmic output signal in accordance with a logarithmic transfer function over a narrow range.
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Inventors:
Jensen, Brent, Earl.
Application Number:
JP52867597A
Publication Date:
April 18, 2000
Filing Date:
February 06, 1997
Export Citation:
Assignee:
Maxim Integrated Products, Inc.
International Classes:
G06G7/24; H03G3/30; H03G7/00; (IPC1-7): H03G11/08; H03F1/30
Attorney, Agent or Firm:
Yoshiki Hasegawa (3 outside)