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Title:
産業用X線撮像装置の劣化判定方法、及び劣化判定装置
Document Type and Number:
Japanese Patent JP7463959
Kind Code:
B2
Abstract:
A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.

Inventors:
Bunta Matsubana
Kobe Goro
Application Number:
JP2020215450A
Publication Date:
April 09, 2024
Filing Date:
December 24, 2020
Export Citation:
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Assignee:
SHIMADZU CORPORATION
International Classes:
G01N23/04; G01T7/00
Domestic Patent References:
JP2012189385A
JP2019124580A
JP2005308600A
JP2010284374A
JP2007135669A
JP2020194864A
JP2019024589A
Attorney, Agent or Firm:
Kushibuchi International Patent Office