To provide a deterioration testing device capable of carrying out a highly accurate deterioration test, in a short time.
This deterioration testing device 100 is used for the light resistance evaluation of a liquid crystal panel 15. The device comprises a laser light source 10 which outputs a laser beam LB used in the deterioration processing for the liquid crystal panel 15, an observation light source 31 which outputs observation light OB used in the optical property evaluation of the liquid crystal panel 15, an observation light detection part 34 which detects the observation light OB, after irradiating the liquid crystal panel 15, and a phase compensation means 50 for compensating for the phase difference of the observation light OB that is incident obliquely with respect to the observation light detection part 34.
Masatake Shiga
Masakazu Aoyama