Title:
誘電特性測定治具、誘電特性測定装置および誘電特性測定方法
Document Type and Number:
Japanese Patent JP7047157
Kind Code:
B2
Abstract:
To provide a jig, device and method for measuring dielectric properties, capable of measuring the dielectric properties with high accuracy.SOLUTION: A jig for measuring dielectric properties, used for measuring the dielectric properties of a sample by a disk resonator method comprises: first and second conductors facing each other and capable of clamping the sample; a third conductor provided in the sample; and pressing means adding a load in the direction of approaching the first and second conductors to each other to an annular region having the center of the third conductor positioned on the inner diameter side in a plan view on the surface of the first conductor on the side opposite to the sample and having a function for fixing the first and second conductors.SELECTED DRAWING: Figure 5
Inventors:
Satoshi Umaji
Application Number:
JP2021040542A
Publication Date:
April 04, 2022
Filing Date:
March 12, 2021
Export Citation:
Assignee:
Sumibe Research Co., Ltd.
Sumitomo Bakelite Co., Ltd.
Sumitomo Bakelite Co., Ltd.
International Classes:
G01R27/26
Domestic Patent References:
| JP2004177234A | ||||
| JP2011206784A | ||||
| JP201663145A | ||||
| JP2007335757A | ||||
| JP2010168232A | ||||
| JP2010165807A |
Attorney, Agent or Firm:
Tatsuya Masuda
Kazuo Asahi
Kazuo Asahi