Title:
二重共焦点走査顕微鏡
Document Type and Number:
Japanese Patent JP4070476
Kind Code:
B2
Abstract:
The present invention concerns a double confocal scanning microscope having an illuminating beam path ( 1 ) of a light source ( 2 ) and a detection beam path ( 3 ) of a detector ( 4 ), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component ( 24, 25 ) acting on the illuminating and/or detection beam path ( 1, 3 ) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.
Inventors:
Hilmer Gugel
Jörg Bevelsdorf
Stephan V. Hell
Jörg Bevelsdorf
Stephan V. Hell
Application Number:
JP2002036734A
Publication Date:
April 02, 2008
Filing Date:
February 14, 2002
Export Citation:
Assignee:
Leica MicroJustems ZMS Gaem Behr
International Classes:
G02B21/14; G02B21/00
Foreign References:
| US5386112 |
Attorney, Agent or Firm:
Kato Asamichi
Kiuchi Uchida
Yasumasa Ishida
Kiuchi Uchida
Yasumasa Ishida