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Patent Searching and Data


Title:
DRIVER CIRCUIT FOR IC TESTER
Document Type and Number:
Japanese Patent JPH07151833
Kind Code:
A
Abstract:

PURPOSE: To adapt a driver circuit to act also as a termination, clamp circuit, by switching operatively an I/O terminal of the driver circuit with an output impedance matching with transmission lines.

CONSTITUTION: In a driver circuit connected, to a device (DUT) by transmission lines, three kinds of analog signals are shifted positively (negatively) by level shifters 310, 315, 325 (320, 330, 335) by the use of a voltage VBEP (VBEN), and an analog multiplexer 350 (380) selects one signal by being controlled 390 by a digital signal and supplies it to an NPN (PNP) transistor 360 (365). And the DUT is driven by switching an I/O terminal between predetermined voltage levels VH, VL with an output impedance Z0 matching with transmission lines. If output of this DUT is specified as to be able to drive a terminal load, the transmission lines are terminated by level-switching the I/O terminal to a predetermined voltage level of the impedance Z0. If not specified, the driver circuit functions like a Z-clamp circuit.


Inventors:
RICHIYAADO EFU HAAREIN
SAAJIO EI SANIEREBICHI
BAANERU JII UESUTO
DEIBITSUDO KEI CHIAN
Application Number:
JP18208994A
Publication Date:
June 16, 1995
Filing Date:
August 03, 1994
Export Citation:
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Assignee:
SCHLUMBERGER TECHNOLOGIES INC
International Classes:
G01R31/28; G01R31/319; H03K5/02; (IPC1-7): G01R31/28; H03K5/02
Attorney, Agent or Firm:
Kazuo Kobashi (1 person outside)