Title:
EL display
Document Type and Number:
Japanese Patent JP6154522
Kind Code:
B2
Abstract:
To increase the proportion of the perfects to the whole lot of final products and to reduce the cost for active matrix EL display devices by checking the operation of a TFT substrate before depositing an EL material. A capacitor for testing is connected to a drain terminal of a driving TFT in a pixel portion to observe charging and discharging of the capacitor. Whether the driving TFT is normal or not is judged by the observation, so that the rejects can be removed before the manufacturing process is completed.
Inventors:
Jun Koyama
Application Number:
JP2016128467A
Publication Date:
June 28, 2017
Filing Date:
June 29, 2016
Export Citation:
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
G09F9/30; G09G3/00; G09G3/32; H01L51/50; H05B33/02; H05B33/12; H05B33/14; H01L27/32
Domestic Patent References:
| JP1124604A | ||||
| JP272392A | ||||
| JP5307167A |
Foreign References:
| US5428300 | ||||
| US5994916 |
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