Title:
成形有向スリットを有するエシェルスペクトロメータ
Document Type and Number:
Japanese Patent JP4044989
Kind Code:
B2
Abstract:
An improved spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The spectrometer provides high detector resolution with reduced read-out time.
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Inventors:
Lin Lin Chien
Application Number:
JP27666997A
Publication Date:
February 06, 2008
Filing Date:
September 25, 1997
Export Citation:
Assignee:
Varian, Incorporated
International Classes:
G21K1/06; G01J3/18; G02B5/18
Domestic Patent References:
| JP2002906A | ||||
| JP8075550A | ||||
| JP61197528U |
Attorney, Agent or Firm:
Inaoka cultivation
Mio Kawasaki
Mio Kawasaki