Title:
ELECTROMAGNETIC INDUCTION TYPE PROBE
Document Type and Number:
Japanese Patent JP3415697
Kind Code:
B2
Abstract:
PURPOSE: To provide means for making wide band properties and small-sized practical usability compatible in an electromagnetic induction type probe for measuring the electric characteristics of solution.
CONSTITUTION: An electromagnetic induction type probe of prior art has a primary transformer having a toroidal core 10 wound with a primary coil 11, a secondary transformer having a toroidal core 12 wound with a secondary coil 13, an electrostatic shield 14 for shielding them, and cables 6, 7 for connecting the probe to a measuring instrument body as main constituents, wherein the structure of the probe is symmetrically formed in order to eliminate the measuring error due to the asymmetry of an electric field generated in the solution. The center-tap terminal (b) of a balancer 31 is connected to the external conductors of the cables 6, 7, and the other terminals (a), (b) are connected to both the ends of the cap of the shield 14 to hold the symmetry of the electric field in the solution up to a high frequency band, thereby realizing the wide band. Since the balancer is contained in the handle of the probe, the probe can be reduced in size.
Inventors:
Hideki Wakamatsu
Application Number:
JP33861594A
Publication Date:
June 09, 2003
Filing Date:
December 29, 1994
Export Citation:
Assignee:
Agilent Technologies, Inc.
International Classes:
G01R1/06; G01N27/02; G01N27/74; G01R27/02; G01R27/22; G01R27/26; (IPC1-7): G01R27/22; G01N27/74; G01R27/26
Domestic Patent References:
| JP815341A | ||||
| JP56107169A | ||||
| JP4015680Y1 |
Attorney, Agent or Firm:
Kimihisa Kato