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Title:
EQUIPMENT FOR MEASURING STATIC OR DYNAMIC SCATTERING OF LIGHT
Document Type and Number:
Japanese Patent JPH10339694
Kind Code:
A
Abstract:

To measure the lights scattering at different scattering angles simultaneously by adjusting each detector at 0° position relatively to a laser beam such that all detectors on a rotary table are directed toward a common point at the center of rotation.

In the measuring equipment, a sample 3 in a container 5 containing a liquid 4 having refractive index identical to that of cuvette glass is irradiated from a laser light source 1. The sample 3 is disposed in the center of a rotary table 7 coaxially with the rotational axis thereof and orthogonally to the laser beam. Scattering light from the sample 3 is detected by a large number of detectors 8 juxtaposed on the rotary table 7 at an arbitrary angle. Each detector is adjusted, by respective adjuster, at each 0° position relatively to the laser beam such that all detectors 8 are directed toward a common point at the center of rotation. According to the arrangement, the lights scattering at different scattering angles can be measured simultaneously.


Inventors:
PETERS WILHELM
Application Number:
JP8141398A
Publication Date:
December 22, 1998
Filing Date:
March 27, 1998
Export Citation:
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Assignee:
ALV LASER VERTRIEBS GMBH
International Classes:
G01J1/00; G01J3/44; G01J3/457; G01N15/14; G01N21/03; G01N15/02; G01N21/47; G01N21/49; G01N21/51; G01J3/28; (IPC1-7): G01N15/14; G01J1/00; G01N15/02; G01N21/03; G01N21/49
Domestic Patent References:
JPH02502482A1990-08-09
JPH08152405A1996-06-11
JPS63149548A1988-06-22
JPH0772068A1995-03-17
Attorney, Agent or Firm:
Mitsufumi Esaki (2 others)