Title:
Examination jig
Document Type and Number:
Japanese Patent JP6161165
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a test jig which can be crimped at stable contact pressure and is hardly detached during a test.SOLUTION: A test jig 1 is fitted to a terminal block so as to perform a test. The test jig 1 has three holding points. The test jig 1 comprises: an insulative holding part 7 locked to a projection provided above a conductive terminal of the terminal block; a conductive part 9 crimped to the conductive terminal of the terminal block; and a contact part 15 brought into contact with a case below the conductive terminal of the terminal block. The conductive part 9 has no elasticity, and pressure is applied by a leaf spring 13 provided as a separate member. Thus, the test jig may be crimped at stable contact pressure. Moreover, because the test jig is held at the three points, it is hardly detached during a test where force is applied in horizontal and lower directions. Also, the test jig only needs to be pulled upward at the time of removing.SELECTED DRAWING: Figure 1
Inventors:
Yoshihiro Izumi
Satoshi Tateishi
Satoshi Tateishi
Application Number:
JP2014260838A
Publication Date:
July 12, 2017
Filing Date:
December 24, 2014
Export Citation:
Assignee:
Shoko Electric Co., Ltd.
International Classes:
H01R43/00; G01R31/04; H01R9/00
Domestic Patent References:
| JP2011090882A | ||||
| JP2013080588A |
Attorney, Agent or Firm:
Koji Hadachi
Shoji Hadachi
Shoji Hadachi