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Patent Searching and Data


Title:
EXAMINATION METHOD USING NUCLEAR MAGNETIC RESONANCE
Document Type and Number:
Japanese Patent JPS61269052
Kind Code:
A
Abstract:

PURPOSE: To enable highly accurate correction, by measuring the nuclear spin information of a standard specimen at an orthogonal coordinates point and correcting the effect of the nuclear spin of an object to be examined at the orthogonal coordinates point due to the non-uniformity of a static magnetic field and a high frequency magnetic field.

CONSTITUTION: The nuclear spin information of an object 16 to be examined in a static magnetic field 14, inclined magnetic fields 8W10 and a high frequency magnetic field 4 is measured and examined by utilizing a NMR phenomena according to a Fourier imaging method. At this time, the nuclear spin information of a standard specimen having uniform nuclear spin distribution at an orthogonal coordinates point is measured and made to the magnitude of the gradient magnetic fields 8W10 to measure the information of the object 16 to be examined. Then, control is performed so that the effect in the latter information due to the non-uniformity of the static magnetic field 14 or the high frequency magnetic field 4 is corrected by the former information. Therefore, the positional strain contained in fundamental data correcting non- uniformity is made equal to the positional strain of the image of the object to be examined and the enhancement of accuracy can be achieved.


Inventors:
YAMAMOTO ETSUJI
KONO HIDEKI
Application Number:
JP11037085A
Publication Date:
November 28, 1986
Filing Date:
May 24, 1985
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
A61B10/00; A61B5/055; G01R33/48; G01R33/565; (IPC1-7): A61B10/00
Attorney, Agent or Firm:
Katsuo Ogawa