Title:
FAILURE MODULE DISCRIMINATION METHOD FOR ELECTRONIC EQUIPMENT
Document Type and Number:
Japanese Patent JP3157047
Kind Code:
B2
Abstract:
PURPOSE: To improve independence of failure separation test at the time of failure part judgement of an electronic device measuring equipment of an IC stator and the like.
CONSTITUTION: On a first step (S10), a failure detection test is carried out on plural module groups, and when failure is detected, it is transferred to a second step (S20), where information about the module groups having failure is prepared and memorized as separate module information. On a third step (S30), a failure separation text is carried out on module groups for a failure separation test, and test module information is prepared. On a fourth step (S40), when module groups for test have failure, information except for module common to both of the module information is deleted from the separation module information. By repeating the third and fourth steps and selecting a failure module candidate, the module to be finally included in the separation module information as information is judged as failure module.
Inventors:
Tomohiko Matsui
Application Number:
JP21088192A
Publication Date:
April 16, 2001
Filing Date:
July 15, 1992
Export Citation:
Assignee:
Agilent Technologies, Inc.
International Classes:
G01R31/00; G01R31/28; (IPC1-7): G01R31/28
Domestic Patent References:
| JP5341005A |
Attorney, Agent or Firm:
Okuyama Shoichi (2 outside)