Title:
GENE METHYLATION EXAMINATION CONTROL
Document Type and Number:
Japanese Patent JP2007125014
Kind Code:
A
Abstract:
To provide a new examination method of methylation gene useful for tumor suppression by elucidating gene methylation phenomena frequently caused in immortalized and deformed cells.
A plasmid is produced by connecting nucleotide sequence control (synthetic nucleotide having methylcytosine, unmodified cytosine or uracil at one or more known position), the plasmid is made linear to produce an imitation of genome nucleic acid sample, and the imitation is provided to the methylation examination and used for the method for evaluating effectiveness of the methylation examination.
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Inventors:
MAZUMDER ABHIJIT
VARDE SHOBHA
BRIGGS THOMAS
VARDE SHOBHA
BRIGGS THOMAS
Application Number:
JP2006294582A
Publication Date:
May 24, 2007
Filing Date:
October 30, 2006
Export Citation:
Assignee:
VERIDEX LLC
International Classes:
C12N15/09; C12Q1/68
Attorney, Agent or Firm:
Hiroaki Tazawa
Konobu Kato
Hideaki Tazawa
Hamada Hatsune
Konobu Kato
Hideaki Tazawa
Hamada Hatsune