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Title:
半導体集積回路の設計方法。
Document Type and Number:
Japanese Patent JP4973561
Kind Code:
B2
Abstract:

To provide a method for designing a semiconductor integrated circuit in the consideration of a variation in a logic composition process.

The method for designing the semiconductor integrated circuit includes steps of: specifying a variation value as a numerical value showing the variation of the delay time of cells; generating a netlist by a logic composition from circuit description; calculating a variation total by totaling variation values of cells configuring each of a plurality of paths reaching the input edge of a flip flop under consideration in the netlist; selecting the maximum value of the variation totals of the plurality of paths as a maximum variation total; selecting the worst value of timing slacks of the plurality of paths as the worst timing slack; and exchanging the cells of the netlist so that the maximum variation total can be decreased in a range in which the worst timing slack can be prevented from being worse than a predetermined slack value.

COPYRIGHT: (C)2010,JPO&INPIT


Inventors:
Nobuaki Nonaka
Application Number:
JP2008080732A
Publication Date:
July 11, 2012
Filing Date:
March 26, 2008
Export Citation:
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Assignee:
Fujitsu Semiconductor Limited
International Classes:
G06F17/50; H01L21/82
Domestic Patent References:
JP2007173509A
JP2007280222A
JP2005092885A
JP8221456A
JP2000082092A
JP2000183171A
JP2009075822A
Attorney, Agent or Firm:
Tadahiko Ito



 
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