Title:
How to identify abnormalities in a picture
Document Type and Number:
Japanese Patent JP6139002
Kind Code:
B2
Abstract:
A method of identifying anomalies in images produced using an imaging device (70). The method comprises receiving (10), (12) first and second pluralities of candidate anomalies, the candidate anomalies being identified in subsequent images produced with an imaging device. A constellation match (14), (16), (18), (19) is carried out between the first and second pluralities of candidate anomalies to identify a correlation therebetween, represented by a constellation match value. A plurality of constellation match values is determined with a different relative x-y shift between the first and second pluralities of candidate images. If a good correlation is found at a particular x-y shift then the candidate anomalies are common between the first and second images, which is indicative of the first and second images including anomalies.
Inventors:
David Clifton
Craig Robertson
Craig Robertson
Application Number:
JP2016113551A
Publication Date:
May 31, 2017
Filing Date:
June 07, 2016
Export Citation:
Assignee:
Optos PLC
International Classes:
G06T7/00; A61B3/14
Domestic Patent References:
| JP2005301524A | ||||
| JP11045919A | ||||
| JP2008252946A | ||||
| JP2005079856A |
Attorney, Agent or Firm:
Kenji Sugimura
Makoto Fukuo
Makoto Fukuo
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