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Patent Searching and Data


Title:
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPH06104267
Kind Code:
A
Abstract:

PURPOSE: To provide a method of making a silicon wafer which can prevent warp of a wafer and also form a gettering site having large gettering effects in a method of manufacturing the silicon wafer having a gettering site for gettering a heavy metal, etc., inside a substrate.

CONSTITUTION: While applying tensile stress in the direction equivalent to the <111> direction or <111> direction of a silicon substrate 12 or an ingot, the ingot is heated in a gas atmosphere containing hydrogen, and thereafter the ingot is cooled while the stress is applied.


Inventors:
HARA AKITO
AOKI MASAKI
Application Number:
JP25005492A
Publication Date:
April 15, 1994
Filing Date:
September 18, 1992
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
H01L21/322; H01L21/324; (IPC1-7): H01L21/322; H01L21/324
Attorney, Agent or Firm:
Keizo Okamoto