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Patent Searching and Data


Title:
IC HANDLING DEVICE
Document Type and Number:
Japanese Patent JPH0772202
Kind Code:
A
Abstract:

PURPOSE: To contrive the reduction of its workhours and the improvement of inspection precision when a heating part of a handler, namely, the temperature distribution precision of an IC measuring part is inspected periodically.

CONSTITUTION: A part from a feed part 4 and a housing part 14 of a normal IC to be measured 10a, another feed part 5 and another housing part 15 for a temperature sensor package 11a wherein a temerature measurement element has been packaged in the form of its IC, a mixture feed part 6 for selectively feeding IC to be measured 10a or the temperature sensor package 11a from these feed parts 4, 5 to a measuring device 8 by an instruction from a handler control part and a fractional mechanism part 12 for sending both ICs to be measured discharged from the measuring device 8 to the housing parts 14, 15 respectively are equipped, so that they are pushed in a normal test and the inspection of temperature distribution precision of a heating part is made possible automatically.


Inventors:
KASE SEIICHI
Application Number:
JP21936893A
Publication Date:
March 17, 1995
Filing Date:
September 03, 1993
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01K7/02; G01R31/26; H01L21/66; G01K1/14; (IPC1-7): G01R31/26; G01K1/14; G01K7/02; H01L21/66
Domestic Patent References:
JPS62280662A1987-12-05
JP3072376U2000-10-13
Attorney, Agent or Firm:
Naoki Kyomoto (2 outside)