Title:
【発明の名称】光学式時系列反射測定方法及び装置
Document Type and Number:
Japanese Patent JP3340849
Kind Code:
B2
Abstract:
PURPOSE:To perform a highly accurate measurement even by using a high-power light source by a constitution wherein the conversion into a radiation at a second wavelength by an induced radiation of a radiation at a first wavelength is suppressed. CONSTITUTION:When the generation of a radiation at a second wavelength id to be suppressed, a first wavelength is selected on the basis of the predetermined attenuation characteristic of an optical fiber in such a way that the first wavelength and every wavelength band are close to a wavelength at a minimum local attenuation factor and that a second wavelength is displaced from the wavelength of the minimum local attenuation factor, and a radiation at the second wavelength can be achieved while it is attenuated more remarkably than the radiation at the first wavelength and every wavelength band. The second wavelength is attenuated in such a way that the second wavelength is made to coincide with the infrared maximum absorption of the attenuation characteristic of the optical fiber or that it is situated at an end part on the short-wavelength side of the maximum absorption or that it is made to coincide with a local maximum absorption corresponding to impurities spontaneously generated in the optical fiber such as hydroxide ions or to doped impurities such as rare-earth metal ions.
More Like This:
Inventors:
Arthur Harold Haltalk
Application Number:
JP16945694A
Publication Date:
November 05, 2002
Filing Date:
July 21, 1994
Export Citation:
Assignee:
OCC Inc.
International Classes:
G01M11/02; G01D5/26; G01D5/353; G01K11/12; G01M11/00; (IPC1-7): G01M11/02; G01D5/26; G01K11/12; G01M11/00
Domestic Patent References:
| JP552673A | ||||
| JP6123661A | ||||
| JP62110160A | ||||
| JP4276531A | ||||
| JP2276932A | ||||
| JP2201129A | ||||
| JP6180256A |
Attorney, Agent or Firm:
Sugimura Kosaku (1 person outside)