PURPOSE: To provide a semiconductor device in which a connection to an exterior is performed by a similar connecting method to that of prior art without using a special method even if a wiring layer is formed of high melting point metal and which has sufficient adhesive properties and low manufacturing cost.
CONSTITUTION: W (tungsten) 102 is sputtered on a semiconductor substrate 101, a resist pattern is formed, the W 102 is etched, the resist is removed, and a wiring layer is formed. Then, an Si3N4 film 103 is formed by a plasma CVD method, a resist pattern is formed, the film 103 is etched by dry etching, the resist is removed, an opening is formed, an Al film 104 is formed as a pad electrode, a resist pattern is formed, the film 104 is etched, the resist is removed and the pad for connecting to an exterior is completely formed.