Title:
【発明の名称】差分信号の交差電圧をテストするための装置及びその方法
Document Type and Number:
Japanese Patent JP3375597
Kind Code:
B2
Abstract:
An apparatus and method for processing a differential-type signal transmitted through a pair of data lines. First, a voltage range defined by an upper reference and a lower reference and a logic pattern are provided. Then, the signal is tested to generate logic data responsive to the voltage range. Next, the logic data are utilized to compare with the logic pattern so as to generate a test result when the signal enters a transition cycle.
Inventors:
Chen Hakugawa
Huang Tai O
Takamori
Huang Tai O
Takamori
Application Number:
JP2000127726A
Publication Date:
February 10, 2003
Filing Date:
April 27, 2000
Export Citation:
Assignee:
Wei Sheng Electronics Co., Ltd.
International Classes:
G06F3/00; G01R31/3193; G06F13/00; H04L69/40; (IPC1-7): H04L29/14; G06F3/00; G06F13/00
Domestic Patent References:
| JP8139742A | ||||
| JP8293899A |
Attorney, Agent or Firm:
Hitoshi Maeda (2 outside)