IC CARD TEST DEVICE, IC CARD TEST METHOD, AND COMPUTER PROGRAM

Title:

IC CARD TEST DEVICE, IC CARD TEST METHOD, AND COMPUTER PROGRAM

Document Type and Number:

Japanese Patent JP2007317085

Kind Code:

A

Abstract:

To provide an IC card test device by which a developer of an IC card program can easily prepare a test pattern.

The IC card test device 1 stores a test script 15 described in script language. When testing the IC card program, the IC card test device 1 successively interprets statements included in the designated test script, and makes an emulator 2 execute the interpreted processing for testing the IC card program stored in the emulator 2. For example, the IC card test device 1 generates a command APDU described with hexadecimal characters according to the program interface specifications of the IC card from the test script described in script language, and tests the IC card program by using the generated command APDU.

Inventors:

ABE YASUSHI

Application Number:

JP2006148215A

Publication Date:

December 06, 2007

Filing Date:

May 29, 2006

Export Citation:

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Assignee:

DAINIPPON PRINTING CO LTD

International Classes:

G06K17/00; G06F11/22; G06F11/28; B42D15/10

Attorney, Agent or Firm:

Satoshi Kanayama
Keiko Fukamachi
Hideo Ito
Hiromi Fujimasu
Naoki Goto

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