To obtain an IC socket in which contact failures are eliminated and an exchange of only a contact unit is easy.

This is constituted to include the base part 101 having a concave part 101a in which an external socket pin 106 is embedded and which receives a tested material pin 108, a slide part 102 that is loaded to the base part 101 and that has a pin guide hole 103 to make the tested material pin 108 pass, and which has a contact supporting hole 104, a slide mechanism 110 to make the slide part 102 slide, and a wire contact 105 whose one end is inserted into the external socket pin 106 and another end is inserted into the contact supporting hole 104.