Title:
IC TESTER
Document Type and Number:
Japanese Patent JP3508823
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To realize an IC tester capable of outputting a high frequency signal, without high level designing.
SOLUTION: The tester is an improved IC tester for testing objects under test and comprises a first formatter 21 for generating a format waveform signal, second formatter 22 for generating a format waveform signal, and exclusive-OR circuit 24 for outputting an exclusive-OR signal of the format waveform signals outputted from the first and second formatters 21, 22 to the object under test when these format wave from signal are inputted. The first and second formatters 21, 22 output format waveform signals and the exclusive-OR circuit 24 outputs an exclusive-OR signal of the format waveform signals to the object under test when these format waveform signals are inputted.
Inventors:
Mihara, Takeshi
Application Number:
JP9323398A
Publication Date:
March 22, 2004
Filing Date:
April 06, 1998
Export Citation:
Assignee:
YOKOGAWA ELECTRIC CORP
International Classes:
G01R31/3183; (IPC1-7): G01R31/3183
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