Title:
IMAGE EXAMINATION APPARATUS
Document Type and Number:
Japanese Patent JP2005341274
Kind Code:
A
Abstract:
To provide an image examination apparatus in which a position of an optical mask can be efficiently adjusted and a visual confirmation level can be made uniform, and which can be small-sized.
The image examination apparatus which is capable of visually confirming sub information by overlapping an optical mask on a recording plane of a recording medium (examination target) with synthetic image information visibly recorded on the recording plane, the synthetic image information being created by embedding the sub information in an invisible state in main image information in a visible state, is provided with an adjustment means for adjusting a rotational relative position and a parallel relative position of the optical mask.
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Inventors:
MIYAZAKI KENJI
MIKI TAKEO
TOKUDA MASAYA
YAMAGUCHI TAKASHI
MIKI TAKEO
TOKUDA MASAYA
YAMAGUCHI TAKASHI
Application Number:
JP2004157853A
Publication Date:
December 08, 2005
Filing Date:
May 27, 2004
Export Citation:
Assignee:
TOSHIBA CORP
International Classes:
G06T1/00; H04N1/387; (IPC1-7): H04N1/387; G06T1/00
Attorney, Agent or Firm:
Takehiko Suzue
Satoshi Kono
Makoto Nakamura
Kurata Masatoshi
Sadao Muramatsu
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura
Kurata Masatoshi
Sadao Muramatsu
Ryo Hashimoto