Title:
IMAGE INSPECTION METHOD, AND IMAGE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2023050842
Kind Code:
A
Abstract:
To provide an image inspection method using an image inspection device (for example, an X-ray inspection device) that, in transferring an image of a faulty part acquired in the past to a transfer destination in an image of a non-defective product, if the resolution of the transfer source image is higher than the resolution of the transfer destination, reduces the resolution of the transfer source image to bring the resolution of the transfer source image closer to the resolution of the transfer destination, and thereby can create a more natural transfer image.SOLUTION: An image inspection method using an image inspection device has a transfer step of transferring one or more images of faulty parts among images discriminated as defective products in the past to a transfer destination in an image discriminated as a non-defective product in the past to create a transfer image, as a part of all steps, and in the transfer step, in transferring the images of the faulty parts to the transfer destination, if the resolution of the images of the faulty parts is higher than the resolution of the transfer destination, reduces the resolution of the images of the faulty parts to bring the resolution of the images of the faulty parts closer to the resolution of the transfer destination.SELECTED DRAWING: Figure 6
Inventors:
OBARA AKIRA
SUGITA SHINJI
KASAHARA KEIGA
MOCHIZUKI AOI
SUGITA SHINJI
KASAHARA KEIGA
MOCHIZUKI AOI
Application Number:
JP2021161168A
Publication Date:
April 11, 2023
Filing Date:
September 30, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G06T7/00
Attorney, Agent or Firm:
Patent Attorney Corporation Shuwa Patent Office
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