Title:
画像検査システム及びその制御方法
Document Type and Number:
Japanese Patent JP7077807
Kind Code:
B2
Abstract:
To provide a technology for supporting specification of a cause in the occurrence of a malfunction, in a system that acquires a plurality of images for inspection by changing the position of a viewpoint to an object to be inspected.SOLUTION: An image inspection system 1 comprises: imaging means 10; moving means 11 that changes the position of a viewpoint of the imaging means to an object to be inspected W; control means that controls the moving means and imaging means to acquire a plurality of images for inspection at respective viewpoints at a plurality of photographing timings; and inspection means that executes inspection of the object to be inspected by using the plurality of images for inspection. The control means performs control of executing photographing with the imaging means at a plurality of recording timings that are timings different from any one of the plurality of photographing timings to acquire a plurality of images for recording at respective viewpoints at the plurality of recording timings.SELECTED DRAWING: Figure 1
Inventors:
Kato Yutaka
Masahiro Takayama
Yuji Yamauchi
Shingo Inazumi
Masahiro Takayama
Yuji Yamauchi
Shingo Inazumi
Application Number:
JP2018112066A
Publication Date:
May 31, 2022
Filing Date:
June 12, 2018
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G01N21/88; G01B11/30; G01N21/84; G05B23/02; G06T1/00
Domestic Patent References:
| JP2009010890A | ||||
| JP2017015396A | ||||
| JP9182057A |
Foreign References:
| US20160379357 |
Attorney, Agent or Firm:
Takehiko Sekine
Nakamura Go
Katsuhiko Imahori
Junichi Wakuda
Hironobu Yazawa
Nakamura Go
Katsuhiko Imahori
Junichi Wakuda
Hironobu Yazawa