To provide an inspection apparatus and inspection method capable of inspecting the display unevenness of a liquid crystal cell before finishing assembly of a liquid crystal module without being affected by inspector's capabilities.
The inspection apparatus 10 is equipped with an oscillator 12 which oscillates a laser 18a, a half mirror 20 which splits the laser 18a to the first laser 18b and the second laser 18c between the oscillator 12 and a color filter substrate 24. a first detector 14 which detects the quantity of light of the first laser 18b, a second detector 16 which detects the quantity of light of the second laser 18c transmitted through the liquid crystal cell 28 and an arithmetic means which calculates the transmittance of the second laser 18c to the liquid crystal cell 28 by the quantity of light detected with the first detector 14 and the quantity of light detected with the second detector 16.
WADA TAKEHIKO
KOJIMA EISAKU
| JPH05196570A | 1993-08-06 | |||
| JPH07243969A | 1995-09-19 | |||
| JPH01313745A | 1989-12-19 | |||
| JPS6138537A | 1986-02-24 | |||
| JPH11201866A | 1999-07-30 |
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