Title:
INSPECTION DEVICE OF IMAGE DISPLAY DEVICE, INSPECTION METHOD, AND IMAGE DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP2004301918
Kind Code:
A
Abstract:
To enhance efficiency and reliability of inspection of an image display device such as a TFT-LCD.
When a driving signal is written in one sample/hold circuit 12, writing potential is measured, the written driving signal is supplied to a pixel circuit 11 to drive the pixel circuit, the driven pixel circuit 11 and a direct connection circuit 15 are connected to each other and driving signal from the driven pixel circuit 11 is outputted. At this time, writing potential and reading potential are measured and inspected. Since the direct connection circuit 15 is provided at the image display device and the potential of the driven pixel circuit 11 can be directly measured, the efficiency and the reliability of the inspection can be enhanced.
Inventors:
IZUMI TAKESHI
ASANO SHIN
ASANO SHIN
Application Number:
JP2003091956A
Publication Date:
October 28, 2004
Filing Date:
March 28, 2003
Export Citation:
Assignee:
SONY CORP
International Classes:
G02F1/13; G02F1/133; G02F1/1345; G09F9/00; G09G3/20; G09G3/36; (IPC1-7): G02F1/13; G02F1/133; G02F1/1345; G09F9/00; G09G3/20; G09G3/36
Attorney, Agent or Firm:
Takahisa Sato