To provide an inspection device for setting a plurality of planar chips using the chips for measuring a sample component by irradiating the sample in the chips with light which is an inspection device capable of preventing the jump-out of the chips even if the chips are arranged vertically, and replacing the chip easily.

The device includes: a chip holder 3 for storing chips 2; a holding stand 4 on which a plurality of chip holders 3 are placed in parallel; a rotating drive part 6 for rotating the holding stand 4 around a rotation axis; a photometric part 9 for irradiating the chips 2 with light, and detecting light acquired by an irradiation result; and a lock mechanism placed on the holding stand 4, and formed on a nearer position to the rotation center of the holding stand 4 than the gravity center of the chips 2. The lock mechanism includes a lock 46 provided on the holding stand 4, and a hook 21 provided on the chip 2 hooked on the lock 46. The chip holder 3 can be moved relative to the holding stand 4 in the vertical direction with respect to the rotation axis 81 when detaching the chips 2.