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Title:
INSPECTION EQUIPMENT FOR SUBSTRATE
Document Type and Number:
Japanese Patent JPH08327658
Kind Code:
A
Abstract:

PURPOSE: To obtain an inspection equipment for substrate in which a substrate to be inspected can be aligned accurately with a contactor at inspecting section.

CONSTITUTION: The inspection equipment for substrate comprises a movable mounting stage 3, a contactor block 30 disposed oppositely to the mounting stage 3 while having a large number of contactors touching respective pads on a substrate, a plurality of alignment pins 33 provided closely to the contactor for each contactor block 30 while keeping a predetermined positional relationship with the contactor 32, means for grasping the positional information of the contactor 32 and the mounting stage 3 with respect to the alignment pins 33 and previously storing the relative positional information as an initial set data, a first camera 34a fixed on the mounting stage 3 movably therewith in order to detect the position of alignment pin 33, a second camera 34b for detecting the position of electrode pad of a substrate 2 mounted on the stage 3, means for calculating the position of the substrate on the stage 3 based on the position detection results thus obtained and an initial set data being called, and means for shifting the stage 3 directly under the contactor block 30 based on the calculated position of the substrate and bringing the pad into contact with the contactor.


Inventors:
IINO SHINJI (JP)
SANO SATOSHI (JP)
Application Number:
JP7433996A
Publication Date:
December 13, 1996
Filing Date:
March 28, 1996
Export Citation:
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Assignee:
TOKYO ELECTRON LTD (JP)
TERU ENG KK (JP)
International Classes:
G01R1/06; G01R31/26; G01R31/28; G06T1/00; G06T7/00; H01L21/66; H01L21/68; G01B11/00; (IPC1-7): G01R1/06; G01B11/00; G01R31/26; G01R31/28; G06T7/00; H01L21/68
Attorney, Agent or Firm:
Takehiko Suzue



 
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