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Title:
INSPECTION METHOD OF PHOTOCATALYST SUBSTRATE UTILIZING LUMINESCENCE
Document Type and Number:
Japanese Patent JP2004012383
Kind Code:
A
Abstract:

To provide an inspection method of a photocatalyst substrate utilizing luminescence capable of discriminating clearly between a part where a photocatalyst layer is formed and a part where application of a photocatalyst coating agent (application liquid) is omitted by using various compounds coloring by being easily oxidized, and inspecting, simply at low cost in a short time, the part where the application of the photocatalyst coating agent is omitted.

This inspection method of the photocatalyst substrate utilizing luminescence is a method for bringing a solution containing materials luminescing by being oxidized into contact with the photocatalyst substrate formed by carrying the photocatalyst layer on a substrate. As the luminescent material, use is made of luminol, lucigenine, luciferin, bis (2, 4, 6-trichlorophenyl)oxalate and anthracene, bis (2, 4, 6-trichlorophenyl)oxalate and tetracene, bis (2, 4-dinitrophenyl)oxalate and anthracene, and bis (2, 4-dinitrophenyl)oxalate and teracene.


Inventors:
ABE SHINJI
Application Number:
JP2002168864A
Publication Date:
January 15, 2004
Filing Date:
June 10, 2002
Export Citation:
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Assignee:
NIPPON SODA CO
International Classes:
B01J35/02; G01N21/78; G01N31/10; (IPC1-7): G01N21/78; B01J35/02; G01N31/10
Attorney, Agent or Firm:
Masaki Hirota
Seiji Ozawa
Haruka Oka