Title:
INSPECTION SUPPORT DEVICE, METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2023168548
Kind Code:
A
Abstract:
To provide an inspection support device, method, and program capable of satisfactorily outputting, in a case where two or more types of damage are detected from a structure, and particularly, two or more types of damage are detected from the same or adjacent positions of the structure, a damage detection result thereof.SOLUTION: A processor of the inspection support device acquires an image obtained by imaging a structure to be inspected and detects damage to the structure on the basis of the acquired image. In a case where two or more types of damage (cracking B and linear free lime C2) to the structure are detected (Fig.16(A)), the processor determines whether or not two or more types of damage are detected from the same or adjacent positions. In a case where determination is made that the cracking B and the linear free lime C2 are detected from the same or adjacent positions when the processor outputs the damage detection result (a damage image, a damage diagram, and the like), the processor preferentially outputs a damage detection result of the linear free lime C2 in accordance with a priority of a damage type (Fig.16(B)).SELECTED DRAWING: Figure 16
Inventors:
HOTTA SHUHEI
Application Number:
JP2023172856A
Publication Date:
November 24, 2023
Filing Date:
October 04, 2023
Export Citation:
Assignee:
FUJIFILM CORP
International Classes:
G01N21/88
Attorney, Agent or Firm:
Kenzo Matsuura
Kazuki Ohara
Kiyoshi Matsumura
Constitutional Matsuura
Shigeyuki Masuda
Kazuki Ohara
Kiyoshi Matsumura
Constitutional Matsuura
Shigeyuki Masuda
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