Title:
INSTRUMENT FOR MEASURING FINE PARTICLE POSITION
Document Type and Number:
Japanese Patent JP3888829
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a instrument for measuring fine particle position capable of measuring on a real-time basis, the position of a fine particle having a grain size of the order of nanometers with an accuracy on the order of nanometers.
SOLUTION: This measuring instrument for measuring on three-dimensional basis the position of a single fine particle 208 in a solution is equipped with a pulse laser light source 201 for measuring the position of the particle 208, a microscope system for irradiating the particle with a laser beam 203 which is made to go out of the source 201, an optical detector 209 for detecting scattered light, emitted from the particle by the irradiation of the beam, a high- speed A/D board 210 for inputting measured signal obtained by the detector 209 into a computer 211, and the computer 211 for storing the measurement signal obtained by the detector 209 as displacement data to process it arithmetically. Data input timing is set, so that the measurement signal obtained by the detector 209 is inputted into the computer 211 at the instant of the laser beam radiation.
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Inventors:
Keiji Sasaki
Junichi Hotta
Junichi Hotta
Application Number:
JP2000081025A
Publication Date:
March 07, 2007
Filing Date:
March 22, 2000
Export Citation:
Assignee:
Japan Science and Technology Agency
International Classes:
G01B11/00; G01N15/00; G01N15/14; G21K1/00; (IPC1-7): G01B11/00; G01N15/00; G01N15/14
Domestic Patent References:
| JP9304266A | ||||
| JP8262329A | ||||
| JP4210231A |
Attorney, Agent or Firm:
Toshio Nishizawa
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