INTEGRATED CIRCUIT WITH POWER TERMINALS FOR TESTING

Title:

INTEGRATED CIRCUIT WITH POWER TERMINALS FOR TESTING

Document Type and Number:

Japanese Patent JPS5362479

Kind Code:

A

Abstract:

PURPOSE:To independently inspect ICs even after assembling into prointed base boards by connecting power source terminals and inside circuits by way of diodes and providing a power source supply path connecting to the testing power source terminals between the inside circuits and the diodes.

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Inventors:

MATSUNO SHIYUNJI

Application Number:

JP13818676A

Publication Date:

June 03, 1978

Filing Date:

November 16, 1976

Export Citation:

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Assignee:

NIPPON ELECTRIC CO

International Classes:

G01R31/26; G01R31/3185; H01L21/66; G01R31/28; H01L21/822; H01L27/02; H01L27/04; H03K19/00; (IPC1-7): G01R31/26; H01L21/66; H01L27/02

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