To provide an intermediate connection device for an IC tester which is easily installable between two boards of the IC tester, for testing the electrical performance of a semiconductor IC chip, etc.

Two plate bodies 42, 44 are disposed in parallel, leaving a prescribed vertical space between them in a relatively movable manner. Sockets 46 are disposed one above the other, to correspond to the upper and lower plate bodies, respectively. The corresponding sockets 46 are electrically connected by flexible wires 48. A spring connector 24 is disposed in each socket 46. Guide pins 60 with tapered ends insertable into guide holes bored in the board are projectingly provided on the upper body 42. Bearings 58 are disposed in surfaces with which the upper and lower bodies 42, 44 make sliding contact during their relative movement. When the board is brought close to the upper body 42 and the pins 60 are inserted into the guide holes, the upper body 42 is shifted relative to the lower body 44 and moved/adjusted into position with the board used as the reference.