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Title:
ION BEAM ETCHING DEVICE AND METHOD THEREOF
Document Type and Number:
Japanese Patent JPH06267904
Kind Code:
A
Abstract:

PURPOSE: To provide an ion beam etching device, which can be used in combination a microwave ion source having a large leakage magnetic field with a plasma bridge type neutralizing device and is long-lived to active gas.

CONSTITUTION: A first solenoid coil 5 is used for producing plasma, which is a microwave ion source. A second solenoid coil 13 is located on the same axis as that of the coil 5 and generates a magnetic field in the opposite direction to the direction of the coil 5 to form a cusp field. A plasma bridge type neutralizing device 14 is provided on the periphery of an ion beam 19 and is arranged on a plane A-A including a ring cusp of the cusp field or on its downstream side. As electrons 20 extracted from the device 14 are diffused in the side of a sample along a line of magnetic force which is formed by the, coil 13, the efficiency, which contributes to a neutralization of the sample 12, of the electrons 20 led out from the device 14 is increased.


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Inventors:
IGA TAKASHI
ICHIMURA SATOSHI
ONO YASUNORI
NATSUI KENICHI
Application Number:
JP5539493A
Publication Date:
September 22, 1994
Filing Date:
March 16, 1993
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
C23F4/00; G01R33/64; H01L21/302; H01L21/3065; H05H1/46; G01N24/14; (IPC1-7): H01L21/302; C23F4/00; H05H1/46
Attorney, Agent or Firm:
Ogawa Katsuo