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Title:
LASER SCANNING MICROSCOPE FOR FLUORESCENCE ANALYSIS
Document Type and Number:
Japanese Patent JP2008033263
Kind Code:
A
Abstract:

To provide a laser scanning microscope for fluorescence analysis which does not require an emission filter.

In the laser scanning microscope for fluorescence analysis, radiation paths for illumination and detection are optically coupled by a dichroic main color splitter (1), and detected light from a sample is guided to a plurality of detectors by another beam splitter (2). The incident angle of illumination light and/or the incident angle of the light from the sample on the surface of at least the main color splitter or at least another splitter is smaller than 45 degrees.


Inventors:
WOLLESCHENSKY RALF
Application Number:
JP2007135645A
Publication Date:
February 14, 2008
Filing Date:
May 22, 2007
Export Citation:
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Assignee:
ZEISS CARL MICROIMAGING GMBH
International Classes:
G02B21/06; G01N21/64
Domestic Patent References:
JPS4933643A1974-03-28
JP2003021788A2003-01-24
JP2005165212A2005-06-23
JP2001142002A2001-05-25
JPH06201999A1994-07-22
Foreign References:
US20060011857A12006-01-19
GB1307032A1973-02-14
US6167173A2000-12-26
US20040012774A12004-01-22
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda